Nagendrran Seturaman is a Senior Product Development Engineer at Micron Technology since June 2025, responsible for developing and debugging Unit Level Reliability test programs for NAND products while collaborating with cross-functional teams. Prior experience includes serving as a Senior Test Engineer at Power Integrations, where Nagendrran led the development of a new testing process, achieving significant cost reductions. Additionally, Nagendrran held roles as a Test Engineer, focusing on cost-effective testing methods and quality standards for semiconductor products, and as a Product Development Engineer at Intel Corporation, ensuring the testability of integrated circuits. Nagendrran started the career with an internship at Celestica, assisting in quality control and documentation. Educational credentials include a Bachelor of Mechatronics Engineering from Universiti Teknologi Malaysia and a Foundation degree in Computer Science from Kolej Matrikulasi Johor.
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