Christian Müller has extensive experience in the semiconductor industry, currently serving as Associate Vice President of IC Validation, Test & Production at Cyient since April 2020. Prior to this role, Christian held various positions at Intel Corporation, including Director of Test Methodology & Innovation for Mobile Communication Chips, where global responsibility for cost-efficient testing methodologies was a primary focus. Christian's earlier career includes significant roles at Infineon Technologies, managing test methodologies for mobile communication chips, and at Siemens, where foundational experience in test development was gained. Christian holds a degree in Electrical and Electronics Engineering from Ruhr University Bochum, graduated in 1990.
This person is not in any teams
This person is not in any offices